Damage-free plasma etching of porous organo-silicate low-k using micro-capillary condensation above-50 °C

被引:19
|
作者
Chanson, R. [1 ]
Zhang, L. [1 ]
Naumov, S. [2 ]
Mankelevich, Yu. A. [3 ]
Tillocher, T. [4 ,5 ]
Lefaucheux, P. [4 ,5 ]
Dussart, R. [4 ,5 ]
De Gendt, S. [6 ]
de Marneffe, J. -F. [1 ]
机构
[1] IMEC Vzw, 75 Kapeldreef, B-3001 Leuven, Belgium
[2] Leibniz Inst Oberflachenmodifizierun, 15 Permoserstr, D-04318 Leipzig, Germany
[3] Moscow MV Lomonosov State Univ, Skobeltsyn Inst Nucl Phys, SINP MSU, Moscow 119991, Russia
[4] Univ Orleans, GREMI, F-45067 Orleans, France
[5] CNRS, F-45067 Orleans, France
[6] Katholieke Univ Leuven, Celestijnenlaan 200F, B-3001 Leuven, Belgium
来源
SCIENTIFIC REPORTS | 2018年 / 8卷
基金
俄罗斯科学基金会;
关键词
LOW DIELECTRIC-CONSTANT; CRYSTALLIZATION; FILMS;
D O I
10.1038/s41598-018-20099-5
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
The micro-capillary condensation of a new high boiling point organic reagent (HBPO), is studied in a periodic mesoporous oxide (PMO) with similar to 34 % porosity and k-value similar to 2.3. At a partial pressure of 3 mT, the onset of micro-capillary condensation occurs around +20 degrees C and the low-k matrix is filled at -20 degrees C. The condensed phase shows high stability from -50 < T <= -35 degrees C, and persists in the pores when the low-k is exposed to a SF6-based plasma discharge. The etching properties of a SF6-based 150W-biased plasma discharge, using as additive this new HBPO gas, shows that negligible damage can be achieved at -50 degrees C, with acceptable etch rates. The evolution of the damage depth as a function of time was studied without bias and indicates that Si-CH3 loss occurs principally through Si-C dissociation by VUV photons.
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页数:12
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  • [1] Damage-free plasma etching of porous organo-silicate low-k using micro-capillary condensation above −50 °C
    R. Chanson
    L. Zhang
    S. Naumov
    Yu. A. Mankelevich
    T. Tillocher
    P. Lefaucheux
    R. Dussart
    S. De Gendt
    J.-F. de Marneffe
    Scientific Reports, 8
  • [2] Damage-free metrology of porous low-k dielectrics using CD-SEM
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