Suppression of deuterium-induced blistering in pre-damaged tungsten exposed to short-duration deuterium plasma

被引：23

作者：

Zhu, Xiu-Li ^{[1
]}

Zhang, Ying ^{[1
]}

Cheng, Long ^{[1
]}

Shi, Li-Qun ^{[2
]}

De Temmerman, Gregory ^{[3
]}

Yuan, Yue ^{[1
]}

Liu, Hui-Ping ^{[4
]}

Lu, Guang-Hong ^{[1
]}

机构：

[1] Beihang Univ, Sch Phys & Nucl Energy Engn, Beijing 100191, Peoples R China

[2] Fudan Univ, Inst Modern Phys, Shanghai 200433, Peoples R China

[3] ITER Org, Route Vinon Verdon,CS90 046, F-13067 St Paul Les Durance, France

[4] Chinese Acad Sci, Inst Modern Phys, Lanzhou 730000, Gansu, Peoples R China

来源：

JOURNAL OF NUCLEAR MATERIALS | 2018年 / 500卷

关键词：

Tungsten; Ion irradiation; Deuterium-induced blistering; Deuterium retention; HIGH-FLUX; LOW-ENERGY; TEMPERATURE-DEPENDENCE; DISPLACEMENT DAMAGE; RETENTION; SURFACE; HYDROGEN; IONS; GAS;

D O I：

10.1016/j.jnucmat.2018.01.007

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Effects of pre-damage by 500 keV argon ion implantation on deuterium-induced blistering in tungsten has been investigated. After low-energy (40 eV) and high-flux (similar to 10(24) D/m(2)s) deuterium plasma exposure with short exposure duration (100 s), a large increase of deuterium retention is found in the predamaged tungsten, while surface blistering is significantly suppressed as compared to the undamaged one. According to elastic recoil detection analysis, a local deuterium concentration peak is observed at a depth of similar to 100 nm for the un-damaged tungsten, which is supposed to be related to the surface blistering with nanometer size. Comparison of deuterium retention in the near surface (within 300 nm) and in the bulk suggests that deuterium inward diffusion is more significant in the pre-damaged tungsten. It is speculated that the creation of deuterium trap-sites and enhancement of deuterium inward diffusion give rise to an increase of critical deuterium concentration for blistering and contribute to the suppressed deuterium-induced blistering on pre-damaged tungsten under the present exposure conditions. (C) 2018 Elsevier B.V. All rights reserved.

引用

页码：295 / 300

页数：6

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