Modeling Oscillator Injection Locking Using the Phase Domain Response

被引：43

作者：

Dunwell, Dustin ^{[1
]}

Carusone, Anthony Chan ^{[1
]}

机构：

[1] Univ Toronto, Edward S Rogers Sr Dept Elect & Comp Engn, Toronto, ON M5S 3G4, Canada

来源：

IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS | 2013年 / 60卷 / 11期

关键词：

Frequency multiplication; impulse sensitivity function (ISF); injection locking; jitter tracking; locking range; locking time; phase-domain modeling; CLOCK; NOISE;

D O I：

10.1109/TCSI.2013.2252654

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper presents a simulation-based model for the behavior of injection-locked oscillators (ILOs) that can be applied to any oscillator topology under any strength of injected signal. By using the phase domain response (PDR) of an oscillator, the proposed model is shown to accurately predict the behavior of ILOs with asymmetric lock ranges or those using injection into multiple locations. It can also model subharmonic injection locking behavior. The model is validated through comparison with SPICE simulations as well as measured results of a multiplying ILO fabricated in 65-nm CMOS.

引用

页码：2823 / 2833

页数：11

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