Precision measurement of complex permittivity and permeability by microwave cavity perturbation technique

被引：0

作者：

Lin, M ^{[1
]}

Wang, Y ^{[1
]}

Afsar, MN ^{[1
]}

机构：

[1] Tufts Univ, Dept Elect & Comp Engn, Medford, MA 02155 USA

来源：

IRMMW-THZ2005: THE JOINT 30TH INTERNATIONAL CONFERENCE ON INFRARED AND MILLIMETER WAVES AND 13TH INTERNATIONAL CONFERENCE ON TERAHERTZ ELECTRONICS, VOLS 1 AND 2 | 2005年

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper demonstrates the precision measurement of complex permittivity and permeability of several dielectric and ferrite materials through microwave cavity perturbation technique. The measurement was performed at C, X, Ku, and K band four frequency ranges. The measured results are discussed and compared with the data published in the literature.

引用

页码：62 / 63

页数：2

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