Automated testbed and real-time port analysis for reconfigurable input-output boards

被引:0
作者
Kanmani, P. [1 ]
GnanaPrakasi, O. S. [1 ]
机构
[1] Christ, Dept Comp Sci & Engn, Bangalore, Karnataka, India
关键词
Automation; RIO boards; digital write; digital read; analog write; analog read;
D O I
10.1080/0951192X.2020.1803141
中图分类号
TP39 [计算机的应用];
学科分类号
081203 ; 0835 ;
摘要
In the computational world, automation plays a vital role in every aspect. The idea of developing and testing Reconfigurable Input-Output (RIO) Boards automatically without manual interaction is a challenging task. Initially, testing was done manually which takes a lot of time and also requires human interaction. With the proposed idea one can reduce human interaction and testing time with smart automated design setup. This testing includes testing of various functionalities of the RIO boards. This can be done by testing the features of each port with its pin configuration. To be more precise, in this process an automated testbed is designed and algorithms are proposed to verify the features of each pin such as Digital Read, Digital Write, Analog Read and Analog Write of the RIO boards along with the motor pins. Thus, the proposed method makes the setup simple, without any complications by giving the instructions to perform the testing process for each board without human interaction. Results show that the proposed method can reduce time consumption 95%, human interaction by 95% and increase testing accuracy to 87%.
引用
收藏
页码:1156 / 1166
页数:11
相关论文
共 19 条
  • [1] [Anonymous], 2009, DES AUT TEST SYST PR
  • [2] Catic V., 2017, TELFOR J, V9, P98
  • [3] Chongwu J., 2009, INT C REL MANT SAF C
  • [4] Cicolani J., 2018, APRESS, V1, DOI [10.1007/978-1-4842-3462-4, DOI 10.1007/978-1-4842-3462-4]
  • [5] Desai P., 2015, PYTHON PROGRAMMING A, DOI [10.17485/ijst/2016/v9i25/92422, DOI 10.17485/IJST/2016/V9I25/92422]
  • [6] Gonçalves J, 2014, 2014 IEEE EMERGING TECHNOLOGY AND FACTORY AUTOMATION (ETFA)
  • [7] Houdek C., 2016, INSPECTION TESTING M
  • [8] Kanimozhi S., 2016, INDIAN J SCI TECHNOL, V9, DOI DOI 10.17485/ijst/2016/v9i25/92422
  • [9] Karmore P., 2013, IEEE C COMP SCI ED I
  • [10] Liechti Chris., 2017, PYSERIAL