Characterization of AC mode scanning ion-conductance microscopy

被引：57

作者：

Pastré, D ^{[1
]}

Iwamoto, H ^{[1
]}

Liu, J ^{[1
]}

Szabo, G ^{[1
]}

Shao, ZF ^{[1
]}

机构：

[1] Univ Virginia, Sch Med, Dept Mol Physiol & Biol Phys, Charlottesville, VA 22908 USA

来源：

ULTRAMICROSCOPY | 2001年 / 90卷 / 01期

基金：

美国国家卫生研究院; 美国国家科学基金会;

关键词：

scanning probe microscopy; biophysics; membrane; topography;

D O I：

10.1016/S0304-3991(01)00096-1

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

A scanning ion-conductance microscope (SICM) with a vibrating probe has been recently developed (vSICM). In this system, the amplitude of the AC ionic current is detected by using a lock-in amplifier locked to the vibration frequency of the probe. Such a scheme allows for a better control of the tip position because the AC ionic current is more sensitive to the probe-surface distance than the DC ionic current used previously. In this paper, we demonstrate the utility of this technique to the imaging of topographically rough specimens and high-resolution imaging over selected small areas. We also show that it is possible to record the DC ionic current simultaneously during the scan, which can reveal additional information not apparent in the images obtained with the AC ionic current. (C) 2001 Elsevier Science B.V. All rights reserved.

引用

页码：13 / 19

页数：7

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