The Lateral and Axial Localization Uncertainty in Super-Resolution Light Microscopy

被引:90
作者
Rieger, Bernd [1 ]
Stallinga, Sjoerd [1 ]
机构
[1] Delft Univ Technol, Quantitat Imaging Grp, NL-2628 CJ Delft, Netherlands
关键词
analytical approximations; localization microscopy; maximum likelihood estimation; single-molecule studies; super-resolution light microscopy; OPTICAL RECONSTRUCTION MICROSCOPY; SINGLE-MOLECULE LOCALIZATION; FLUORESCENCE MICROSCOPY; RESOLUTION; NANOSCOPY; ACCURACY; TRACKING; PROBES; MODEL; STORM;
D O I
10.1002/cphc.201300711
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
A study of the uncertainty of localizing single-molecule emitters for super-resolution light microscopy is presented. Maximum likelihood estimation (MLE) is found to be superior to least-squares fitting for low background levels, but the performance difference between the two methods decreases to a few percent for practical background levels. It is shown that the performance limit of MLE, the Cramer-Rao lower bound, is well described by a concise analytical formula with only spot width and signal and background photon count as input parameters. These predictions for the lateral localization uncertainty are compared with the localization error obtained from repeated localizations of the same single-molecule emitter. Agreement within a few percent is found, thus verifying the validity of the fitting model and the concise analytical approximation. The analysis is extended by novel analytical results for the dependence of the axial localization uncertainty on background level for the astigmatic, bifocal, and double-helix methods.
引用
收藏
页码:664 / 670
页数:7
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