共 11 条
[1]
[Anonymous], 1993, PROBABILITY RANDOM V
[2]
Fast MTF measurement of CMOS imagers using ISO 12233 slanted-edge methodology
[J].
DETECTORS AND ASSOCIATED SIGNAL PROCESSING,
2004, 5251
:243-252
[5]
EXPERIMENTS ON SPACE AND WAVELENGTH DEPENDENCE OF SPECKLE
[J].
APPLIED PHYSICS,
1975, 7 (03)
:157-169
[6]
MODULATION TRANSFER-FUNCTION MEASUREMENT OF SPARSE-ARRAY SENSORS USING A SELF-CALIBRATING FRINGE PATTERN
[J].
APPLIED OPTICS,
1994, 33 (22)
:5029-5036
[7]
GENERALIZED SAMPLING EXPANSION
[J].
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS,
1977, 24 (11)
:652-654
[8]
MODULATION-TRANSFER-FUNCTION ANALYSIS FOR SAMPLED IMAGE SYSTEMS
[J].
APPLIED OPTICS,
1984, 23 (15)
:2572-2582
[10]
METHOD FOR THE MEASUREMENT OF THE MODULATION TRANSFER-FUNCTION OF SAMPLED IMAGING-SYSTEMS FROM BAR-TARGET PATTERNS
[J].
APPLIED OPTICS,
1995, 34 (04)
:746-751