A Comparative Study of Cluster Based Outlier Detection, Distance Based Outlier Detection and Density Based Outlier Detection Techniques

被引:0
作者
Mandhare, Harshada C. [1 ]
Idate, S. R. [1 ]
机构
[1] Bharati Vidyapeeth Coll Engn, Dept Informat Technol, Pune, Maharashtra, India
来源
2017 INTERNATIONAL CONFERENCE ON INTELLIGENT COMPUTING AND CONTROL SYSTEMS (ICICCS) | 2017年
关键词
Clusters; Outlier Detection; Cluster Based Outlier Detection; Distance Based Outlier Detection; Density Based Outlier Detection;
D O I
暂无
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
as there is an increasing demand of data, outlier detection is coming across as a popular field of research. Outlier is stated as an observation which is dissimilar from the other observations present in the data set. It is advantageous in the fields like medical industry, crime detection, fraudulent transaction, public safety etc. Outlier can be learnt in different fields like big data, time series data, high dimension data, biological data, uncertain data and many more. Most of the time 10% of the whole sample data set is incorrect, not accessible or missing sometimes. This paper studies and compares the popular outlier detection algorithms namely, Cluster based outlier detection, Distance based outlier detection and Density based outlier detection. Comparative study of these outlier detection techniques is performed to find out most efficient outlier detection method for calculation of the outlier.
引用
收藏
页码:931 / 935
页数:5
相关论文
共 22 条
[1]  
Agrawal C.C., 2008, P 2008 SIAM INT C DA
[2]  
Behera Sourajit, 2016, INT C INV COMP TECHN
[3]  
Bin Wang, 2009, 2009 9 IEEE INT C CO
[4]  
Christy A., 2015, PROCEDIA COMPUTER SC
[5]  
Daneshpazhouh Armin, 2014, PATTERN RECOGNITION
[6]  
Deris Mustafa, 2006, IEEE C CYB INT SYST
[7]  
Deshmukh Harshada S., 2015, INT J ADV RES COMPUT
[8]  
Gupta Manish, 2014, IEEE T KNOWLEDGE DAT
[9]  
Ha Jihyun, 2014, KNOWLEDGE BASED SYST
[10]   Outlier detection using k-nearest neighbour graph [J].
Hautamäki, V ;
Kärkkäinen, I ;
Fränti, P .
PROCEEDINGS OF THE 17TH INTERNATIONAL CONFERENCE ON PATTERN RECOGNITION, VOL 3, 2004, :430-433