Reflectivity characterization of various black and white materials

被引：5

作者：

Schmidt, Luke M. ^{[1
]}

Conway, Brant ^{[1
]}

DePoy, Darren L. ^{[1
]}

Marshall, Jennifer L. ^{[1
]}

Oelkers, Ryan J. ^{[1
]}

机构：

[1] Texas A&M Univ, Dept Phys & Astron, 4242 TAMU, College Stn, TX 77843 USA

来源：

ADVANCES IN OPTICAL AND MECHANICAL TECHNOLOGIES FOR TELESCOPES AND INSTRUMENTATION V | 2022年 / 12188卷

关键词：

optical instrumentation; infrared instrumentation; scattered light; stray light; black materials; white materials; calibration screens; reflectivity;

D O I：

10.1117/12.2630244

中图分类号：

TH [机械、仪表工业];

学科分类号：

0802 ;

摘要：

We report on an expanded catalog(1-4) of various common (and uncommon) black and white materials used in the construction and/or baffling of optical systems and as screen material for calibration systems. Total reflectance is measured over a broad wavelength range (250 nm < lambda < 2500 nm) that is applicable to ultraviolet, visible, and near-infrared instrumentation. Reflectivity data for the complete sample inventory will be available via Filtergraph, an online data visualization tool.

引用

页数：7

共 5 条

[1] Filtergraph: An interactive web application for visualization of astronomy datasets
Burger, Dan
Stassun, Keivan G.
Pepper, Joshua
Siverd, Robert J.
Paegert, Martin
De Lee, Nathan M.
Robinson, William H.
[J]. ASTRONOMY AND COMPUTING, 2013, 2 : 40 - 45
[2] Gardner L. E., 2018, PROCSPIE, V10706
[3] Characterization of the Reflectivity of Various Black Materials
Marshall, Jennifer L.
Williams, Patrick
Rheault, Jean-Philippe
Prochaska, Travis
Allen, Richard D.
Depoy, D. L.
[J]. GROUND-BASED AND AIRBORNE INSTRUMENTATION FOR ASTRONOMY V, 2014, 9147
[4] Schmidt L. M., 2018, PROCSPIE, V10706, P10706
[5] Schmidt L. M., 2020, ADV OPTICAL MECH TEC, V11451, P575

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