Computer Simulation of Phase-Contrast Images in White Synchrotron Radiation Using Micropipes in Silicon Carbide

被引:8
作者
Argunova, T. S. [1 ]
Kohn, V. G. [2 ]
Je, Jung Ho [3 ]
机构
[1] Russian Acad Sci, AF Ioffe Phys Tech Inst, St Petersburg 196140, Russia
[2] Kurchatov Inst, Russian Res Ctr, Moscow, Russia
[3] Pohang Univ Sci & Technol, Dept Mat Sci & Engn, X Ray Imaging Ctr, Pohang, South Korea
基金
俄罗斯基础研究基金会;
关键词
D O I
10.1134/S1027451008060062
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
A method of computer simulation of phase-contrast images in white synchrotron radiation has been developed to determine the section parameters of micropipes in silicon carbide. The experiments have been carried out using the third-generation synchrotron radiation source the Pohang Light Source (South Korea). The effective spectrum of the synchrotron radiation that forms of an image has been shown to have a relatively sharp maximum at an energy of 16 keV, which makes it possible to conserve coherency within the required limits. A computer program has been developed that automatically determines the diameters of an elliptic section of a micropipe from the condition of coincidence of calculated and experimental profiles. It has been shown that the studied micropipes have a strongly stretched elliptic section that can twist when moving along the pipe axis.
引用
收藏
页码:861 / 865
页数:5
相关论文
共 13 条
[1]  
[Anonymous], 1973, NUMERICAL METHODS
[2]   Phase objects in synchrotron radiation hard x-ray imaging [J].
Cloetens, P ;
Barrett, R ;
Baruchel, J ;
Guigay, JP ;
Schlenker, M .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1996, 29 (01) :133-146
[3]   CAPILLARY EQUILIBRIA OF DISLOCATED CRYSTALS [J].
FRANK, FC .
ACTA CRYSTALLOGRAPHICA, 1951, 4 (06) :497-501
[4]   Interaction of micropipes with foreign polytype inclusions in SiC [J].
Gutkin, M. Yu. ;
Sheinerman, A. G. ;
Argunova, T. S. ;
Yi, J. M. ;
Kim, M. U. ;
Je, J. H. ;
Nagalyuk, S. S. ;
Mokhov, E. N. ;
Margaritondo, G. ;
Hwu, Y. .
JOURNAL OF APPLIED PHYSICS, 2006, 100 (09)
[5]   Direct evidence of micropipe-related pure superscrew dislocations in SiC [J].
Huang, XR ;
Dudley, M ;
Vetter, WM ;
Huang, W ;
Wang, S ;
Carter, CH .
APPLIED PHYSICS LETTERS, 1999, 74 (03) :353-355
[6]   Coherence-enhanced synchrotron radiology: Refraction versus diffraction mechanisms [J].
Hwu, Y ;
Hsieh, HH ;
Lu, MJ ;
Tsai, WL ;
Lin, HM ;
Goh, WC ;
Lai, B ;
Je, JH ;
Kim, CK ;
Noh, DY ;
Youn, HS ;
Tromba, G ;
Margaritondo, G .
JOURNAL OF APPLIED PHYSICS, 1999, 86 (08) :4613-4618
[7]   Structural transformation of screw dislocations via thick 4H-SiC epitaxial growth [J].
Kamata, I ;
Tsuchida, H ;
Jikimoto, T ;
Izumi, K .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2000, 39 (12A) :6496-6500
[8]   Study of micropipe structure in SiC by x-ray phase contrast imaging [J].
Kohn, V. G. ;
Argunova, T. S. ;
Je, Jung Ho .
APPLIED PHYSICS LETTERS, 2007, 91 (17)
[9]   AN OPTICAL AND X-RAY TOPOGRAPHIC STUDY OF GIANT SCREW DISLOCATIONS IN SILICON-CARBIDE [J].
KRISHNA, P ;
JIANG, SS ;
LANG, AR .
JOURNAL OF CRYSTAL GROWTH, 1985, 71 (01) :41-56
[10]   Coherent X-ray imaging investigation of macrodefects and micropipes on SiC [J].
Milita, S ;
Madar, R ;
Baruchel, J ;
Anikin, M ;
Argunova, T .
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 1999, 61-2 :63-67