Analysis of Switching Clamped Oscillations of SiC MOSFETs

被引:12
作者
Ke, Junji [1 ]
Zhao, Zhibin [1 ]
Xie, Zongkui [1 ]
Wei, Changjun [1 ]
Cui, Xiang [1 ]
机构
[1] North China Elect Power Univ, State Key Lab Alternate Elect Power Syst Renewabl, Beijing, Peoples R China
基金
国家重点研发计划;
关键词
Analytical model; Current distortion; Maximum peak shifting; Oscillation frequency; Parasitic parameter; SiC MOSFET; GATE DRIVER; TEMPERATURE; PERFORMANCE;
D O I
10.6113/JPE.2018.18.3.892
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
SiC MOSFETs have been used to improve system efficiency in high frequency converters due to their extremely high switching speed. However, this can result in undesirable parasitic oscillations in practical systems. In this paper, models of the key components are introduced first. Then, theoretical formulas are derived to calculate the switching oscillation frequencies after full turn-on and turn-off in clamped inductive circuits. Analysis indicates that the turn- on oscillation frequency depends on the power loop parasitic inductance and parasitic capacitances of the freewheeling diode and load inductor. On the other hand, the turn-off oscillation frequency is found to be determined by the output parasitic capacitance of the SiC MOSFET and power loop parasitic inductance. Moreover, the shifting regularity of the turn-off maximum peak voltage with a varying switching speed is investigated on the basis of time domain simulation. The distortion of the turn-on current is theoretically analyzed. Finally, experimental results verifying the above calculations and analyses are presented.
引用
收藏
页码:892 / 901
页数:10
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