Linear imaging theory for differential phase contrast and other phase imaging modes in scanning transmission electron microscopy

被引：9

作者：

Seki, Takehito ^{[1
,2
]}

Khare, Kushagra ^{[3
]}

Murakami, Yoshiki O. ^{[1
]}

Toyama, Satoko ^{[1
]}

Sanchez-Santolino, Gabriel ^{[1
,7
,8
]}

Sasaki, Hirokazu ^{[4
]}

Findlay, Scott D. ^{[3
]}

Petersen, Timothy C. ^{[5
]}

Ikuhara, Yuichi ^{[1
,6
]}

Shibata, Naoya ^{[1
,6
]}

机构：

[1] Univ Tokyo, Sch Engn, Inst Engn Innovat, Tokyo 1138656, Japan

[2] Japan Sci & Technol Agcy, PRESTO, Kawaguchi, Saitama 3320012, Japan

[3] Monash Univ, Sch Phys & Astron, Clayton, Vic 3800, Australia

[4] Furukawa Elect Corp Ltd, Anal Technol Ctr, Yokohama, Kanagawa 2200073, Japan

[5] Monash Univ, Monash Ctr Electron Microscopy, Clayton, Vic 3800, Australia

[6] Japan Fine Ceram Ctr, Nanostruct Res Lab, Atsuta Ku, Nagoya, Aichi 4568587, Japan

[7] Univ Complutense Madrid, Dept Fis Mat, Madrid 28040, Spain

[8] Univ Complutense Madrid, Inst Pluridisciplinar, Madrid 28040, Spain

来源：

ULTRAMICROSCOPY | 2022年 / 240卷

基金：

澳大利亚研究理事会;

关键词：

STEM; DETECTOR; FIELDS; RECONSTRUCTION; SPECIMENS; VISUALIZATION; SAMPLES;

D O I：

10.1016/j.ultramic.2022.113580

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

We propose a linear imaging theory for differential phase contrast under the weak-phase-weak-amplitude object approximation. Contrast transfer functions are defined for thin and thick weak objects, and they successfully describe several imaging characteristics of differential phase contrast. We discuss the defocus dependence of the contrast for several examples: atomic resolution, a p-n junction, a heterointerface, and grain boundaries. Understanding the imaging characteristics helps in adjusting aberrations in DPC STEM.

引用

页数：11

共 49 条

[1] THE SPECIMEN THICKNESS EFFECT UPON THE ELECTRON-MICROSCOPE IMAGE-CONTRAST TRANSFER OF AMORPHOUS OBJECTS [J].