Acoustic pulse echoes probed with time-resolved x-ray triple-crystal diffractometry

被引:19
|
作者
Hayashi, Y [1 ]
Tanaka, Y
Kirimura, T
Tsukuda, N
Kuramoto, E
Ishikawa, T
机构
[1] Kyushu Univ, Interdisciplinary Grad Sch Engn Sci, Kasuga, Fukuoka 8168580, Japan
[2] Kyushu Univ, Res Inst Appl Mech, Kasuga, Fukuoka 8168580, Japan
关键词
D O I
10.1103/PhysRevLett.96.115505
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Acoustic pulse echoes generated by femtosecond laser irradiation were detected using time-resolved x-ray triple-crystal diffractometry. The determined time-dependent longitudinal strain component for pulse echoes in silicon and gallium arsenide plates showed that the polarity of the strain pulse was dependent on the optically induced initial stress, and that the bipolar pulse waveform was gradually deformed and broadened in the course of propagation. The three-dimensional wave front distortion of pulse echoes was shown simply as the pulse duration broadening, which was consistent with a boundary roughness for an unpolished plate.
引用
收藏
页数:4
相关论文
共 50 条
  • [31] Sensitivity of triple-crystal X-ray diffractometers to microdefects in silicon
    Molodkin, V. B.
    Olikhovskii, S. I.
    Len, E. G.
    Kislovskii, E. N.
    Kladko, V. R.
    Reshetnyk, O. V.
    Vladimirova, T. R.
    Sheludchenko, B. V.
    PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 2009, 206 (08): : 1761 - 1765
  • [32] Separation of the Mechanisms of Photoinduced Deformations in Crystals Using Time-Resolved X-ray Diffractometry
    F. S. Pilyak
    A. G. Kulikov
    Yu. V. Pisarevsky
    A. E. Blagov
    M. V. Kovalchuk
    Crystallography Reports, 2022, 67 : 791 - 798
  • [33] TIME-RESOLVED DOUBLY BENT CRYSTAL X-RAY SPECTROMETER
    HOCKADAY, MP
    WILKE, MD
    BLAKE, RL
    VANINETTI, J
    GRAY, NT
    NEDROW, PT
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1988, 59 (08): : 1822 - 1824
  • [34] TOROIDALLY CURVED CRYSTAL FOR TIME-RESOLVED X-RAY SPECTROSCOPY
    HAUER, A
    KILKENNY, JD
    LANDEN, OL
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1985, 56 (05): : 803 - 805
  • [35] Time-Resolved Single-Crystal X-Ray Crystallography
    Raithby, Paul R.
    21ST CENTURY CHALLENGES IN CHEMICAL CRYSTALLOGRAPHY I: HISTORY AND TECHNICAL DEVELOPMENTS, 2020, 185 : 239 - 271
  • [36] Ultrafast structural dynamics in InSb probed by time-resolved x-ray diffraction
    Chin, AH
    Schoenlein, RW
    Glover, TE
    Balling, P
    Leemans, WP
    Shank, CV
    PHYSICAL REVIEW LETTERS, 1999, 83 (02) : 336 - 339
  • [37] Ultrafast structural dynamics in InSb probed by time-resolved X-ray diffraction
    Chin, AH
    Schoenlein, RW
    Glover, TE
    Balling, P
    Leemans, WP
    Shank, CV
    ULTRAFAST PHENOMENA XI, 1998, 63 : 401 - 403
  • [38] X-ray triple-crystal diffractometry and transmission electron microscopy characterization of defects in lattice-mismatched epitaxic structures
    Kyutt, RN
    Ruvimov, SS
    Argunova, TS
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1995, 28 (pt 6): : 700 - 706
  • [39] X-ray diffraction studies of annealed Czochralski-grown silicon. II. Triple-crystal diffractometry
    Zaumseil, Peter
    Joksch, Stefan
    Zulehner, Werner
    Journal of Applied Crystallography, 1993, 26 (pt 2): : 192 - 197
  • [40] Triple-crystal diffractometry, x-ray standing wave and reciprocal space mapping study of homoepitaxial grown Si layers
    Mukhamedzhanov, E
    Kummer, M
    Dommann, A
    JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2000, 33 (17) : 2087 - 2091