Automatic test program generation:: A case study

被引：92
作者：
Corno, F
Sánchez, E
Reorda, MS
Squillero, G
机构：
[1] Politecn Torino, Dipartimento Automat & Informat, I-10129 Turin, Italy
[2] Politecn Torino, Dept Comp Sci, I-10129 Turin, Italy
来源：
IEEE DESIGN & TEST OF COMPUTERS | 2004年 / 21卷 / 02期
关键词：
D O I：
10.1109/MDT.2004.1277902
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
A simulation-based methodology different from pure or biased pseudorandom methods was proposed. The approach calls for the generation of a set of test programs and optimization using the feedback information from a simulator able to evaluate them with respect to a given coverage metric. The use of such a method can dramatically help designers and engineers: Instead of checking massive random simulations for differences with respect to the correct model, validation experts can let the automatic test case generator work for the proper time and eventually examine the test set it produces.
引用
收藏
页码：102 / 109
页数：8
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