Microscopy - Extra dimension with X-rays

被引：4

作者：

Cargill, GS ^{[1
]}

机构：

[1] Lehigh Univ, Dept Mat Sci & Engn, Bethlehem, PA 18015 USA

来源：

NATURE | 2002年 / 415卷 / 6874期

关键词：

Micrometers - Microscopic examination - Modification - X rays;

D O I：

10.1038/415844a

中图分类号：

O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];

学科分类号：

07 ; 0710 ; 09 ;

摘要：

Materials science has benefited from X-ray imaging at the micrometre scale, but imaging has been restricted to two dimensions. A clever modification takes us into the third dimension.

引用

页码：844 / 845

页数：2

共 7 条

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