Metalorganic chemical vapor deposition and characterization of ZnO materials

被引:6
|
作者
Sun, SZ [1 ]
Tompa, GS
Hoerman, B
Look, DC
Claflin, BB
Rice, CE
Masaun, P
机构
[1] Struct Mat Ind Inc, Piscataway, NJ 08854 USA
[2] Wright State Univ, Dayton, OH 45435 USA
关键词
ZnO; metalorganic chemical vapor deposition (MOCVD); wide bandgap; transparent conducting oxide;
D O I
10.1007/s11664-006-0136-7
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Zinc oxide is attracting growing interest for potential applications in electronics, optoelectronics, photonics, and chemical and biochemical sensing, among other applications. We report herein our efforts in the growth and characterization of p- and n-type ZnO materials by metalorganic chemical vapor deposition (MOCVD), focusing on recent nitrogen-doped films grown using diethyl zinc as the zinc precursor and nitric oxide (NO) as the dopant. Characterization results, including resistivity, Hall measurements, photoluminescence, and SIMS, are reported and discussed. Electrical behavior was observed to be dependent on illumination, atmosphere, and heat treatment, especially for p-type material.
引用
收藏
页码:766 / 770
页数:5
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