共 19 条
- [1] A Si-Backside Protection Circuits Against Physical Security Attacks on Flip-Chip Devices 2019 IEEE ASIAN SOLID-STATE CIRCUITS CONFERENCE (A-SSCC), 2019, : 25 - 28
- [3] Backside probing of flip-chip circuits using electrostatic force sampling Annual Proceedings - Reliability Physics (Symposium), 1999, : 337 - 340
- [4] Backside probing of flip-chip circuits using electrostatic force sampling 1999 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM PROCEEDINGS - 37TH ANNUAL, 1999, : 337 - 340
- [6] Capturing Defects in Flip-Chip CMOS Devices Using Backside EBAC Technique and SEM Microscopy ISTFA 2016: CONFERENCE PROCEEDINGS FROM THE 42ND INTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE ANALYSIS, 2016, : 118 - 124
- [8] Backside illuminated AlGaN-on-Si UV detectors integrated by high density flip-chip bonding PHYSICA STATUS SOLIDI C: CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 8, NO 7-8, 2011, 8 (7-8): : 2476 - 2478
- [9] Flip-chip bonded Si Schottky diode sampling circuits for high speed demultiplexers 2003 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST, VOLS 1-3, 2003, : 1515 - 1518
- [10] A Novel Structure for Backside Protection Against Physical Attacks on Secure Chips or SiP 2018 IEEE 68TH ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC 2018), 2018, : 515 - 520