FLUKA Simulations of DPA in 6H-SiC Reactor Blanket Material Induced by Different Radiation Fields Frequently Mentioned in Literature

被引:10
作者
Korkut, Turgay [1 ]
Korkut, Hatun [1 ]
机构
[1] Ibrahim Cecen Univ Agri, Fac Sci & Art, Dept Phys, TR-04100 Agri, Turkey
关键词
Reactor; Blanket; 6H-SiC; FLUKA; DPA; DISPLACEMENT DAMAGE; PROTON IRRADIATION; ELECTRON-IRRADIATION; HOLE CONCENTRATION; SILICON-CARBIDE; SEMICONDUCTORS; MECHANISMS; TRANSITION;
D O I
10.1007/s10894-012-9525-5
中图分类号
TL [原子能技术]; O571 [原子核物理学];
学科分类号
0827 ; 082701 ;
摘要
Silicon carbide (SiC) is used extensively for the production of high-tech semiconductor devices. Today the use of this material in radiation environments such as fusion reactors creates excitement in the nuclear industry. Specific radiation types and energies which semiconductors were frequently exposed are of great value in terms of high-tech device studies. We used FLUKA simulation code to investigate radiation induced effects in 6H-SiC for different energetic protons, neutrons, photons and electrons in this paper. We analyzed displacement per atom values taking account of the simulation results in a very large perspective of radiation type and energy.
引用
收藏
页码:66 / 70
页数:5
相关论文
共 51 条
[1]  
Albrow M., 2007, P AIP C, V896, P31
[2]  
Antonuk L.E., 1990, IEEE T NUCL SCI, V32, P4382
[3]   Electrical characterization of 1.8 MeV proton-bombarded ZnO [J].
Auret, FD ;
Goodman, SA ;
Hayes, M ;
Legodi, MJ ;
van Laarhoven, HA ;
Look, DC .
APPLIED PHYSICS LETTERS, 2001, 79 (19) :3074-3076
[4]  
Bartko J., 1977, U. S. Pat, Patent No. [4056408, 40564081]
[5]  
Battistoni G., 2006, P HADR SHOW SIM WORK
[6]   EVIDENCE FOR DAMAGE REGIONS IN SI GAAS AND INSB SEMICONDUCTORS BOMBARDED WITH HIGH-ENERGY NEUTRONS [J].
BERTOLOTTI, M ;
PAPA, T ;
SETTE, D ;
VITALI, G .
JOURNAL OF APPLIED PHYSICS, 1967, 38 (06) :2645-+
[7]   Neutron irradiation effects in SiC [J].
Brink, D. J. ;
Malherbe, J. B. ;
Camassel, J. .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2009, 267 (16) :2716-2718
[8]   Deep levels by proton and electron irradiation in 4H-SiC [J].
Castaldini, A ;
Cavallini, A ;
Rigutti, L ;
Nava, F ;
Ferrero, S ;
Giorgis, F .
JOURNAL OF APPLIED PHYSICS, 2005, 98 (05)
[9]   5.5-MEV PROTON IRRADIATION OF A STRAINED-QUANTUM-WELL LASER-DIODE AND A MULTIPLE-QUANTUM-WELL BROAD-BAND LED [J].
EVANS, BD ;
HAGER, HE ;
HUGHLOCK, BW .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1993, 40 (06) :1645-1654
[10]  
Ferrari A, 2005, CERN-2005-10, INFN/TC_05/11, SLAC-R-773