Electronic Structure of Nanocrystalline Silicon and Oxidized Silicon Surfaces

被引:3
|
作者
Milovzorov, D. [1 ]
机构
[1] Moscow MV Lomonosov State Univ, Dept Phys, Div Elect, Moscow 119899, Russia
关键词
D O I
10.1149/1.1373378
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
Laser picosecond spectroscopy was used for studying the electronic structure of silicon surfaces and films. The method of band-gap determination by estimating the exponential decay time was proposed. The oxidation of silicon surface was important for quantum beats phenomena and connected with defect production in grain boundary of silicon nanocrystallites. Also, the career density decay process in irradiated polycrystalline silicon films was studied by using the pump-probe laser scheme. (C) 2001 The Electrochemical Society. [DOI: 10.1149/1.1373378] All rights reserved.
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页码:G61 / G63
页数:3
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