HAFTA: Highly Available Fault-Tolerant Architecture to Protect SRAM-Based Reconfigurable Devices Against Multiple Bit Upsets

被引:8
作者
Ghaderi, Zana [1 ]
Miremadi, Seyed Ghassem [1 ]
Asadi, Hossein [1 ]
Fazeli, Mahdi [1 ]
机构
[1] Sharif Univ Technol, Dept Comp Engn, Tehran 111559517, Iran
关键词
Availability; multiple bit upsets (MBUs); reliability; SRAM-based reconfigurable devices (SRDs); TRIPLE MODULAR-REDUNDANCY; SOFT ERRORS; FPGA; TMR; PERFORMANCE; MITIGATION; RELIABILITY; SYSTEMS; PLACE;
D O I
10.1109/TDMR.2012.2229710
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Despite widespread use of SRAM-based reconfigurable devices (SRDs) in mainstream applications, their usage has been very limited in enterprise and safety-critical applications due to SRAM susceptibility to soft errors. Previous mitigation techniques to protect SRDs impose significant area and power overheads. Additionally, they suffer from susceptibility of configuration bits to multiple bit upsets (MBUs). In this paper, we present a highly available fault-tolerant architecture to protect SRD-based designs against MBUs in both configuration and user bits. In the proposed architecture, the entire design is duplicated with respect to the relative locations of logic blocks within the SRD and the main and replica flip-flops (FFs) are compared at each clock cycle to detect any possible mismatch. In addition, the unused FFs available throughout SRDs are employed as history FFs to save the latest correct state of the system. Upon detection of any mismatch between the main and replica FFs, the system is able to roll back to the latest correct state stored in the history FFs. The simulation results extracted using fault injection experiments demonstrate that the proposed architecture provides both higher reliability and availability, as compared with the traditional triple modular redundancy techniques, while offering less area and power overheads.
引用
收藏
页码:203 / 212
页数:10
相关论文
共 42 条
[1]   New Techniques for Improving the Performance of the Lockstep Architecture for SEEs Mitigation in FPGA Embedded Processors [J].
Abate, F. ;
Sterpone, L. ;
Lisboa, C. A. ;
Carro, L. ;
Violante, M. .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2009, 56 (04) :1992-2000
[2]   Soft error susceptibility analysis of SRAM-based FPGAs in high-performance information systems [J].
Asadi, Hossein ;
Tahoori, Mehdi B. ;
Mullins, Brian ;
Kaeli, David ;
Granlund, Kevin .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2007, 54 (06) :2714-2726
[3]   Analytical techniques for soft error rate Modeling and mitigation of FPGA-based designs [J].
Asadi, Hossein ;
Tahoori, Mehdi B. .
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2007, 15 (12) :1320-1331
[4]  
BRGLEZ F, 1989, 1989 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOLS 1-3, P1929, DOI 10.1109/ISCAS.1989.100747
[5]  
Chi-Chen Peng, 2011, 2011 16th Asia and South Pacific Design Automation Conference, ASP-DAC 2011, P388, DOI 10.1109/ASPDAC.2011.5722219
[6]  
Gill BS, 2007, DES AUT TEST EUROPE, P1460
[7]   Single-event-upset (SEU) awareness in FPGA routing [J].
Golshan, S. ;
Bozorgzadeh, E. .
2007 44TH ACM/IEEE DESIGN AUTOMATION CONFERENCE, VOLS 1 AND 2, 2007, :330-+
[8]  
Golshan S, 2009, DES AUT TEST EUROPE, P1124
[9]   Transient errors and rollback recovery in LZ compression [J].
Huang, WJ ;
McCluskey, EJ .
2000 PACIFIC RIM INTERNATIONAL SYMPOSIUM ON DEPENDABLE COMPUTING, PROCEEDINGS, 2000, :128-135
[10]  
Jing NF, 2011, ICCAD-IEEE ACM INT, P582, DOI 10.1109/ICCAD.2011.6105389