SEQUENTIAL LOGIC CIRCUITS RELIABILITY ANALYSIS

被引：8
|
作者：
Jahanirad, Hadi [1 ]
Mohammadi, Karim [1 ]
机构：
[1] Iran Univ Sci & Technol Narmak, Coll Elect Engn, Tehran 16844, Iran
来源：
JOURNAL OF CIRCUITS SYSTEMS AND COMPUTERS | 2012年 / 21卷 / 05期
关键词：
Sequential circuits; reliability; PTM; error probability; conditional probability;
D O I：
10.1142/S0218126612500405
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
Reliability analysis using error probabilities for combinational logic circuits has been investigated widely in the literature. Reliability analysis for sequential logic circuits using these methods would be inaccurate because of existence of loops in their architecture. In this paper a new method based on conversion of sequential circuit to combinational one and applying an iterative reliability analysis is developed. A Monte Carlo method-based reliability analysis is introduced for sequential circuits, which is used for first method validation. Experimental results demonstrate good accuracy of the method.
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收藏
页数：17
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