Sample heating system for spin-polarized scanning electron microscopy

被引：3

作者：

Kohashi, Teruo ^{[1
]}

Motai, Kumi ^{[2
]}

机构：

[1] Hitachi Ltd, Cent Res Lab, Hatoyama, Saitama 3500395, Japan

[2] Hitachi Ltd, Cent Res Lab, Kokubunji, Tokyo 1858601, Japan

来源：

MICROSCOPY | 2013年 / 62卷 / 04期

关键词：

spin; magnetic domain; high temperature; SEM; secondary electrons; Co; MAGNETIC MICROSTRUCTURE; SECONDARY ELECTRONS; SURFACE; COBALT; FILMS;

D O I：

10.1093/jmicro/dfs132

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

A sample-heating system for spin-polarized scanning electron microscopy (spin SEM) has been developed and used for microscopic magnetization analysis at temperatures up to 500 degrees C. In this system, a compact ceramic heater and a preheating operation keep the ultra-high vacuum conditions while the sample is heated during spin SEM measurement. Moreover, the secondary-electron collector, which is arranged close to the sample, was modified so that it is not damaged at high temperatures. The system was used to heat a Co(1000) single-crystal sample from room temperature up to 500 degrees C, and the magnetic-domain structures were observed. Changes of the domain structures were observed around 220 and 400 degrees C, and these changes are considered to be due to phase transitions of this sample.

引用

页码：429 / 436

页数：8

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