High-resolution detection of small distance changes by an optical frequency comb

被引:0
作者
Cip, O. [1 ]
Cizek, M. [1 ]
Buchta, Z. [1 ]
Mikel, B. [1 ]
Lazar, J. [1 ]
Smid, R. [1 ]
机构
[1] Acad Sci Czech Republ, Inst Sci Instruments, CS-61264 Brno, Czech Republic
来源
18TH CZECH-POLISH-SLOVAK OPTICAL CONFERENCE ON WAVE AND QUANTUM ASPECTS OF CONTEMPORARY OPTICS | 2012年 / 8697卷
关键词
laser interferometer; scale linearity; femtosecond comb; optical resonator; LASER;
D O I
10.1117/12.2012651
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The work presents a measurement of lengths by an optical measuring resonator. The resonator works as distance-to-optical frequency converter with ultimate linearity. It has locked a tunable laser to certain cavity mode. The optical frequency of the laser is heterodyned with immediate "tooth" of the femtosecond comb spectrum. For the testing of the method the special combination of the optical resonator and Michelson interferometer was put together. This system combines the cavity length of the optical resonator with the measuring arm of the Michelson laser interferometer. The one mirror of the system is common for both laser interferometers and it is driven by piezoelectric transducer. The testing range is limited by the range of tuneability of the used laser and it covers 1000 nm of the length measurement.
引用
收藏
页数:7
相关论文
共 20 条
  • [1] Small displacement measurements with subatomic resolution by beat frequency measurements
    Cip, O.
    Petru, F.
    Buchta, Z.
    Lazar, J.
    [J]. MEASUREMENT SCIENCE AND TECHNOLOGY, 2007, 18 (07) : 2005 - 2013
  • [2] A scale-linearization method for precise laser interferometry
    Cíp, O
    Petru, F
    [J]. MEASUREMENT SCIENCE AND TECHNOLOGY, 2000, 11 (02) : 133 - 141
  • [3] Accurate and traceable measurement of nano- and microstructures
    Dai, GL
    Pohlenz, F
    Xu, M
    Koenders, L
    Danzebrink, HU
    Wilkening, G
    [J]. MEASUREMENT SCIENCE AND TECHNOLOGY, 2006, 17 (03) : 545 - 552
  • [4] Multidimensional interferometric tool for the local probe microscopy nanometrology
    Hrabina, Jan
    Lazar, Josef
    Klapetek, Petr
    Cip, Ondrej
    [J]. MEASUREMENT SCIENCE AND TECHNOLOGY, 2011, 22 (09)
  • [5] Metrological Atomic Force Microscope Using a Large Range Scanning Dual Stage
    Kim, Jong-Ahn
    Kim, Jae Wan
    Kang, Chu-Shik
    Eom, Tae Bong
    [J]. INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING, 2009, 10 (05) : 11 - 17
  • [6] The design of a compact and tunable extended-cavity semiconductor laser
    Lazar, J
    Cíp, O
    Ruzicka, B
    [J]. MEASUREMENT SCIENCE AND TECHNOLOGY, 2004, 15 (01) : N6 - N9
  • [7] Laser diode current controller with a high level of protection against electromagnetic interference
    Lazar, J
    Jedlicka, P
    Cíp, O
    Ruzicka, B
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 2003, 74 (08) : 3816 - 3819
  • [8] Electronics for He-Ne-I-2 stabilized laser with digital control
    Lazar, J
    Cip, O
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1997, 68 (10) : 3660 - 3665
  • [9] Local probe microscopy with interferometric monitoring of the stage nanopositioning
    Lazar, J.
    Klapetek, P.
    Cip, O.
    Cizek, M.
    Sery, M.
    [J]. MEASUREMENT SCIENCE AND TECHNOLOGY, 2009, 20 (08)
  • [10] Suppression of Air Refractive Index Variations in High-Resolution Interferometry
    Lazar, Josef
    Cip, Ondrej
    Cizek, Martin
    Hrabina, Jan
    Buchta, Zdenek
    [J]. SENSORS, 2011, 11 (08): : 7644 - 7655