ZrO2-TiO2 thin films and resonators for mid-infrared integrated photonics

被引:0
作者
Jiang, Feipeng [1 ]
Duan, Ningyuan [1 ]
Lin, Hongtao [2 ]
Li, Lan [2 ]
Hu, Juejun [2 ]
Bi, Lei [1 ]
Lu, Haipeng [1 ]
Weng, Xiaolong [1 ]
Xie, Jianliang [1 ]
Deng, Longjiang [1 ]
机构
[1] Univ Elect Sci & Technol China, State Key Lab Elect Thin Films & Integrated Devic, Beijing, Peoples R China
[2] Univ Delaware, Dept Mat Sci & Engn, Newark, DE 19716 USA
来源
2014 IEEE PHOTONICS SOCIETY SUMMER TOPICAL MEETING SERIES | 2014年
关键词
Mid-infrared; thin films; optical resonators; chemical sensing; SILICON;
D O I
10.1109/SUM.2014.27
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We present a novel MIR transparent ZrO2-TiO2 thin film material system deposited at room temperature. Microdisk resonator showing high quality factor at 5.2 mu m wavelength is demonstrated, indicating their promising potential for integrated MIR photonic applications.
引用
收藏
页码:63 / 64
页数:2
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  • [1] Demonstration of high-Q mid-infrared chalcogenide glass-on-silicon resonators
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    Li, Lan
    Zou, Yi
    Danto, Sylvain
    Musgraves, J. David
    Richardson, Kathleen
    Kozacik, Stephen
    Murakowski, Maciej
    Prather, Dennis
    Lin, Pao T.
    Singh, Vivek
    Agarwal, Anu
    Kimerling, Lionel C.
    Hu, Juejun
    [J]. OPTICS LETTERS, 2013, 38 (09) : 1470 - 1472
  • [2] TiO2/polyaniline nanocomposite films prepared by magnetron sputtering combined with plasma polymerization process
    Pal, Arup R.
    Sarma, Bimal K.
    Adhikary, Nirab C.
    Chutia, Joyanti
    Bailung, Heremba
    [J]. APPLIED SURFACE SCIENCE, 2011, 258 (03) : 1199 - 1205
  • [3] Integrated high-quality factor silicon-on-sapphire ring resonators for the mid-infrared
    Shankar, Raji
    Bulu, Irfan
    Loncar, Marko
    [J]. APPLIED PHYSICS LETTERS, 2013, 102 (05)
  • [4] DETERMINATION OF THE THICKNESS AND OPTICAL-CONSTANTS OF AMORPHOUS-SILICON
    SWANEPOEL, R
    [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1983, 16 (12): : 1214 - 1222
  • [5] Phonons and lattice dielectric properties of zirconia
    Zhao, XY
    Vanderbilt, D
    [J]. PHYSICAL REVIEW B, 2002, 65 (07) : 1 - 10