Identification of dislocations on fracture surface of single crystal alumina by X-ray topography

被引：1

作者：

Tatami, J ^{[1
]}

Saiki, A ^{[1
]}

Yasuda, K ^{[1
]}

Matsuo, Y ^{[1
]}

机构：

[1] Yokohama Natl Univ, Fac Engn, Hodogaya Ku, Yokohama, Kanagawa 2408501, Japan

来源：

JOURNAL OF THE CERAMIC SOCIETY OF JAPAN | 1999年 / 107卷 / 11期

关键词：

fracture; dislocation; single crystal alumina; X-ray topography;

D O I：

10.2109/jcersj.107.1063

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

X-ray topographic images of several refraction planes of single crystal alumina were taken with the reflection Berg-Barret technique of X-ray topography. Linear contrasts were observed in X-ray topographic images of fracture surfaces of single crystal alumina. It was shown that dislocations were produced due to the fracture of single crystal alumina even at the room temperature. The comparison among X-ray topograph images made it clear that there were dislocations with several types of Burgers vector near the fracture surface of single crystal alumina, and about 70% of the dislocations were the basal dislocations. X-ray topography is shown to be a powerful technique for obtaining information about dislocations near by the fracture surface of ceramics.

引用

页码：1063 / 1066

页数：4