Application of the substructured finite element/extended finite element method (S-FE/XFE) to the analysis of cracks in aircraft thin walled structures

被引:25
作者
Wyart, E. [1 ]
Coulon, D. [1 ]
Pardoen, T. [2 ]
Remacle, J. F. [3 ]
Lani, F. [1 ]
机构
[1] Cenaero, Ctr Rech Aeronaut, B-6041 Gosselies, Belgium
[2] Catholic Univ Louvain, Dept Mat Sci & Proc, B-1348 Louvain, Belgium
[3] Catholic Univ Louvain, Dept Civil Engn, B-1348 Louvain, Belgium
关键词
Fracture mechanics; Stress intensity factor; Extended finite element method; Domain decomposition; Thin walled structure; LEVEL SETS; X-FEM; GROWTH; STRESS; SIMULATION;
D O I
10.1016/j.engfracmech.2008.04.025
中图分类号
O3 [力学];
学科分类号
08 ; 0801 ;
摘要
The substructured finite element/extended finite element (S-FE/XFE) approach is used to compute stress intensity factors in large aircraft thin walled structures containing cracks. The structure is decomposed into a 'safe' domain modeled with classical shell elements and a 'cracked' domain modeled using three-dimensional extended finite elements. Two applications are presented and discussed, supported by validation test cases. First a section of stiffened panel containing a through-thickness crack is investigated. Second. small surface cracks are simulated in the case of a generic 'pressure membrane' with realistic crack configurations. These two semi-industrial benchmarks demonstrate the accuracy, robustness and computational efficiency of the substructured finite element/extended finite element approach to address complex three-dimensional crack problems within thin walled structures. (c) 2008 Elsevier Ltd. All rights reserved.
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页码:44 / 58
页数:15
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