Comparison of 10 MeV electron beam radiation effect on InGaN/GaN and GaN/AlGaN multiple quantum wells

被引:8
|
作者
Li, Qingxuan [1 ,2 ]
Li, Bo [3 ,4 ]
Wang, Lei [3 ,4 ]
Zheng, Zhongming [1 ,2 ]
Zhang, Baoping [1 ,2 ]
Liu, Ningyang [5 ]
Li, Binhong [3 ,4 ]
Liu, Mengxin [3 ,4 ]
Huang, Yang [3 ,4 ]
Gong, Zheng [5 ]
Chen, Zhitao [5 ]
Liu, Xinyu [3 ,4 ,6 ]
Luo, Jiajun [3 ,4 ,6 ]
Han, Zhengsheng [3 ,4 ,6 ]
机构
[1] Xiamen Univ, Coll Elect Sci & Technol, Lab Micro Nanooptoelect, Xiamen 361005, Fujian, Peoples R China
[2] Xiamen Univ, Coll Elect Sci & Technol, Dept Elect Engn, Xiamen 361005, Fujian, Peoples R China
[3] Chinese Acad Sci, Key Lab Silicon Device Technol, Beijing 100029, Peoples R China
[4] Chinese Acad Sci, Inst Microelect, Beijing 100029, Peoples R China
[5] Guangdong Inst Semicond Ind Technol, Guangzhou 510650, Guangdong, Peoples R China
[6] Univ Chinese Acad Sci, Beijing 100049, Peoples R China
基金
中国国家自然科学基金;
关键词
InGaN/GaN; GaN/AlGaN; Radiation effect; Non-radiation recombination centers; Exciton localization energy; Internal quantum efficiency; PHOTOLUMINESCENCE;
D O I
10.1016/j.jlumin.2019.02.034
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Radiation effects of 10 MeV electrons on blue-lighting InGaN/GaN multiple quantum wells (MQWs) and ultraviolet-lighting GaN/AlGaN MQWs were investigated and compared by means of temperature-dependent and time-resolved photoluminescence (PL) methods. It was found that GaN/AlGaN MQWs showed better radiation tolerance than InGaN/GaN MQWs. In detail, the internal quantum efficiency of InGaN/GaN MQWs decreased sharply with increasing electron irradiation fluence whereas that of GaN/AlGaN MQWs remained nearly constant. The degradation of the emission properties of InGaN/GaN MQWs after irradiation was attributed to the generation of non-radiation recombination centers (NRCs) in MQWs. On the other hand, the radiation hardness of GaN/AlGaN MQWs was proved to be related to two factors: the irradiation-induced reduction of both exciton localization energy and NRC density. The results reported here are significant for the evaluation and design of GaN-based optoelectronic and electronic devices used in radiation environments.
引用
收藏
页码:169 / 174
页数:6
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