A scanning SQUID microscope for samples at room temperature

被引：16

作者：

Dechert, J ^{[1
]}

Mueck, M ^{[1
]}

Heiden, C ^{[1
]}

机构：

[1] Univ Giessen, Inst Phys Appl, D-35390 Giessen, Germany

来源：

IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY | 1999年 / 9卷 / 02期

关键词：

D O I：

10.1109/77.783930

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We report on the development of a scanning SQUID microscope for measurements of samples at room temperature. A thin film niobium DC-SQUID is used with conventional read-out electronics. It is placed above the thin bottom window of a fiberglass cryostat, allowing us to realize a distance of about 75 mu m between SQUID and sample. The evaporation rate for the liquid helium was about 0.3 l/h, Because the effective SQUID area can easily be brought below 10 mu m(2), the obtainable spatial resolution of such a scanning SQUID microscope is limited mainly by the distance between SQUID and sample. The sample is moved under the cryostat with a computer controlled XY-stage. Provisions are made for quick sample changes which are important for the practical application of such a device.

引用

页码：4111 / 4114

页数：4

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