共 4 条
- [1] ANALYSIS OF REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION DATA FROM RECONSTRUCTED SEMICONDUCTOR SURFACES [J]. PHYSICAL REVIEW B, 1984, 29 (02): : 814 - 819
- [2] MOLECULAR-BEAM EPITAXIALLY GROWN ZNSE(001) SURFACE STUDIED BY THE INSITU OBSERVATION OF RHEED INTENSITY [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1991, 30 (08): : 1647 - 1652