Characterization of the local layer structure at a broad wall in a surface stabilized ferroelectric liquid crystal during electric field application using synchrotron X-ray microdiffraction

The local layer structure response to the electric field was characterized at and around the broad wall of a zig-zag defect in a surface stabilized ferroelectric liquid crystal cell by a synchrotron X-ray microbeam. The rocking curves were measured as a function of the applied voltage and the frequency. The broad peak appearing in the rocking curve at the broad wall changed into a single, sharp peak when the electric field was applied to the cell, while the rocking curve returned to the initial profile when the electric field was switched off. This observation suggests that the pseudo-bookshelf structure at the broad wall becomes the bookshelf structure with the application of electric field. The frequency dependence of the rocking curve profile indicates the relaxation time of the local layer response to the electric field. At a high electric field, a stripe texture comprised a pair of pseudo-bookshelf structures, each of which tilted in the opposite direction with respect to the rubbing direction, was generated from the broad wall.