Simulation possibilities of vacuum electronic devices with CST PARTICLE STUDIO™

被引：0

作者：

Balk, Monika C. ^{[1
]}

机构：

[1] CST GmbH, D-64289 Darmstadt, Germany

来源：

2008 IEEE INTERNATIONAL VACUUM ELECTRONICS CONFERENCE | 2008年

关键词：

EM simulation; PIC; gun code; particle interfaces; wakefield; thermal simulation; FIT;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Due to high prototyping costs and the need of a time efficient development the importance of simulation programs has increased in almost all areas. The CST STUDIO SUITE (TM) is widely used for the design and analysis of RF components using CST MICROWAVE STUDIO (R) (MWS). For simulations including charged particles still MAFIA was used. With the recent developments CST PARTICLE STUDIO (TM) has filled the gap between the established CST MWS and the charged particle simulations required for investigations of vacuum tubes. In this paper recent developments are presented.

引用

页码：456 / 457

页数：2