Controlled Positioning of Nanoparticles on Graphene by Noninvasive AFM Lithography

被引：13

作者：

Bellido, Elena ^{[1
]}

Ojea-Jimenez, Isaac ^{[1
]}

Ghirri, Alberto ^{[3
]}

Alvino, Christian ^{[3
,4
]}

Candini, Andrea ^{[3
]}

Puntes, Victor ^{[2
]}

Affronte, Marco ^{[3
,4
]}

Domingo, Neus ^{[1
]}

Ruiz-Molina, Daniel ^{[1
]}

机构：

[1] Ctr Invest Nanociencia & Nanotecnol ICN CSIS Esfe, Cerdanyola Del Valles 08193, Spain

[2] Inst Catala Recerca & Estudis Avancats ICREA, Barcelona 08093, Spain

[3] Ist Nanosci CNR, Ctr S3, I-41100 Modena, Italy

[4] Univ Modena & Reggio Emilia, Dipartimento Fis, I-41100 Modena, Italy

来源：

LANGMUIR | 2012年 / 28卷 / 33期

关键词：

DIP-PEN NANOLITHOGRAPHY; MOLECULAR NANOMAGNETS; GOLD NANOPARTICLES; ACTIVE CATALYSTS; LAYER GRAPHENE; SINGLE; OXIDE; NANOCRYSTALS; SURFACES; DEVICES;

D O I：

10.1021/la3023419

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Atomic force microscopy is shown to be an excellent lithographic technique to directly deposit nanoparticles on graphene by capillary transport without any previous functionalization of neither the nanoparticles nor the graphene surface while preserving its integrity and conductivity properties. Moreover this technique allows for (sub)micrometric control on the positioning thanks to a new three-step protocol that has been designed with this aim. With this methodology the exact target coordinates are registered by scanning the tip over the predetermined area previous to its coating with the ink and deposition. As a proof-of-concept, this strategy has successfully allowed the controlled deposition of few nanoparticles on 1 mu m(2) preselected sites of a graphene surface with high accuracy.

引用

页码：12400 / 12409

页数：10

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