RADIATION EFFECTS IN PHASE-LOCKED LOOP

被引：0

作者：

Elesin, V. V. ^{[1
]}

Kuznetsov, A. G. ^{[1
]}

Sotskov, D., I ^{[1
]}

机构：

[1] Natl Res Nucl Univ, Moscow Engn Phys Inst, 31 Kashirskoye Highway, Moscow 115409, Russia

来源：

2014 24TH INTERNATIONAL CRIMEAN CONFERENCE MICROWAVE & TELECOMMUNICATION TECHNOLOGY (CRIMICO) | 2014年

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

An analysis of total dose and dose rate effects in phase-locked loop (PLL) ICs is presented. New radiation hardness test results for a variety of commercial and experimental PLL ICs are obtained.

引用

页码：858 / 859

页数：2

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