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Analysis and Compact Modeling of Magnetic Tunnel Junctions Utilizing Voltage-Controlled Magnetic Anisotropy
被引:32
作者:
Lee, Hochul
[1
,2
]
Lee, Albert
[1
]
Wang, Shaodi
[1
]
Ebrahimi, Farbod
[1
,2
]
Gupta, Puneet
[1
]
Amiri, Pedram Khalili
[1
,2
]
Wang, Kang L.
[1
]
机构:
[1] Univ Calif Los Angeles, Dept Elect Engn, Los Angeles, CA 90095 USA
[2] Inston Inc, Los Angeles, CA 90095 USA
基金:
美国国家科学基金会;
关键词:
Macrospin compact model;
magnetic tunnel junction (MTJ);
voltage-controlled magnetic anisotropy (VCMA);
write error rate (WER);
ATOMIC LAYERS;
TORQUE;
MRAM;
EXPLORATION;
D O I:
10.1109/TMAG.2017.2788010
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
A macrospin compact model of a perpendicularly magnetized voltage- controlled magnetic tunnel junction (MTJ) is introduced, for the evaluation of electronic and magnetic characteristics associated with its switching behavior. The voltage- driven precessional switching has been shown to outperform current-driven switching in terms of energy, speed, and bit density. However, to realize the device in embedded system memory applications, developing a compact model for simulating hybrid MTJ/CMOS circuits is necessary. This framework also needs to be compatible with conventional computer-aided circuit design tools and flows. In this paper, the voltage- controlled magnetic anisotropy effect is included as a component of the effective magnetic field in a Landau-Lifshitz-Gilbert (LLG) equation-based model. The compact model is described by Verilog-A, providing a numerical solution for a 3-D magnetization trajectory and the corresponding conductance change of the MTJ. We also include the thermal noise effect in the LLG equation to allow the evaluation of stochastic switching behavior under a wide variety of bias conditions, which can be quantified in terms of write error rate (WER). It is shown that the model allows for optimization of write pulse shape and design considerations to achieve the lowest WER for given MTJ parameters.
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页数:9
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