Survivable self-checking sequential circuits

被引：16

作者：

Levin, I ^{[1
]}

Matrosova, A ^{[1
]}

Ostanin, S ^{[1
]}

机构：

[1] Tel Aviv Univ, IL-69978 Tel Aviv, Israel

来源：

2001 IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS, PROCEEDINGS | 2001年

关键词：

D O I：

10.1109/DFTVS.2001.966793

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

This paper presents a method for designing totally self-checking synchronous sequential circuits (SSC) and investigates their behavior in presence of transient faults. We deal with the case when the circuit is able to recover after the number of clocks. We call SSC owing this property as a survivable SSC. A concept of a partially monotonous SSC is developed in the paper. It is proven that the partially monotonous SSCs are survivable.

引用

页码：395 / 402

页数：8

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