Single photon source characterization with a superconducting single photon detector

被引:135
作者
Hadfield, RH
Stevens, MJ
Gruber, SS
Miller, AJ
Schwall, RE
Mirin, RP
Nam, SW
机构
[1] Natl Inst Stand & Technol, Boulder, CO 80305 USA
[2] Albion Coll, Dept Phys, Albion, MI 49924 USA
来源
OPTICS EXPRESS | 2005年 / 13卷 / 26期
关键词
D O I
10.1364/OPEX.13.010846
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Superconducting single photon detectors (SSPD) based on nanopatterned niobium nitride wires offer single photon counting at fast rates, low jitter, and low dark counts, from visible wavelengths well into the infrared. We demonstrate the first use of an SSPD, packaged in a commercial cryocooler, for single photon source characterization. The source is an optically pumped, microcavity-coupled InGaAs quantum dot, emitting single photons at 902 nm. The SSPD replaces the second silicon Avalanche Photodiode (APD) in a Hanbury-Brown Twiss interferometer measurement of the source second-order correlation function, g((2))(iota). The detection efficiency of the superconducting detector system is > 2 % ( coupling losses included). The SSPD system electronics jitter is 170 ps, versus 550 ps for the APD unit, allowing the source spontaneous emission lifetime to be measured with improved resolution. Work of US government: not subject to US copyright.
引用
收藏
页码:10846 / 10853
页数:8
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