Role of dislocation scattering on electron mobility in coalescent epitaxial lateral overgrowth layers of InP

被引:5
作者
Oyama, Yutaka [1 ]
机构
[1] Tohoku Univ, Dept Mat Sci & Engn, Grad Sch Engn, Sendai, Miyagi 9808579, Japan
关键词
VAPOR-PHASE EPITAXY; III-V COMPOUNDS; GAN; PRESSURE; GROWTH;
D O I
10.1063/1.4864016
中图分类号
O59 [应用物理学];
学科分类号
摘要
In order to clarify the effects of dislocation scattering on electron transport properties, temperature dependent (15-300 K) Hall-effect measurements were applied to the dislocated coalescent and dislocation-free non-coalescent ELO layers of InP prepared by the liquid phase epitaxy. The coalescent ELO layers contain a large number of dislocations, and the non-coalescent ELO layers are dislocation-free. Taking into account, the various electron scattering mechanisms in compound semiconductors, the temperature dependences of electron mobility were analyzed. It is shown that the dislocation scattering based on the charged dislocation line model is dominant transport mechanism in the dislocated coalescent ELO layers at low temperature. (C) 2014 AIP Publishing LLC.
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页数:4
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