共 45 条
Modelling of the implantation and the annealing stages of 800 keV 3He implanted tungsten: Formation of nanovoids in the near surface region
被引:30
作者:
De Backer, A.
[1
,2
]
Lhuillier, P. E.
[3
,4
]
Becquart, C. S.
[1
,2
]
Barthe, M. F.
[3
,4
]
机构:
[1] Univ Lille 1, Unite Mat & Transformat, UMET, UMR 8207, F-59655 Villeneuve Dascq, France
[2] EDF CNRS Etud & Modelisat Microstruct Vieillissem, Paris, France
[3] CNRS, CEMHTI UPR3079, F-45071 Orleans 2, France
[4] Univ Orleans, Fac Sci, F-45067 Orleans 2, France
关键词:
HELIUM ION IRRADIATION;
MONTE-CARLO-SIMULATION;
LOW-ENERGY;
MICROSTRUCTURE EVOLUTION;
POSITRON-ANNIHILATION;
POINT-DEFECTS;
DYNAMICS;
RETENTION;
BEHAVIOR;
METALS;
D O I:
10.1016/j.jnucmat.2012.05.024
中图分类号:
T [工业技术];
学科分类号:
08 ;
摘要:
The formation of voids in tungsten implanted at room temperature with 800 keV He-3 atoms and subsequently annealed from 300 K to 900 K is modelled using an Object Kinetic Monte Carlo code. Different fluences are investigated ranging from 10(17) to 5 x 10(20) ions m(-2) and comparisons are made with Positron Annihilation Spectroscopy results. Good agreements with the experimental results are obtained regarding the temperature range at which the vacancy clustering occurs and the dependency of the nanovoid size with thence. Despite the small amount of He atoms in the investigated region named "track region", their role is underlined and it is shown that they act as nuclei for the nanovoid formation. The non trivial consequence is that the higher the fluence, the smaller the nanovoids in the track region. (C) 2012 Elsevier B.V. All rights reserved.
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页码:78 / 91
页数:14
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