Snapshot advantage: a review of the light collection improvement for parallel high-dimensional measurement systems

被引：101

作者：

Hagen, Nathan ^{[1
]}

Kester, Robert T. ^{[2
]}

Gao, Liang ^{[1
]}

Tkaczyk, Tomasz S. ^{[1
]}

机构：

[1] Rice Univ, Dept Bioengn, Houston, TX 77005 USA

[2] Rebell Photon Inc, Houston, TX 77021 USA

来源：

OPTICAL ENGINEERING | 2012年 / 51卷 / 11期

基金：

美国国家卫生研究院;

关键词：

snapshot; imaging spectrometry; high-dimensional systems; advantage; throughput; MAPPING SPECTROMETER IMS; IMAGING SPECTROMETER; SPECTROSCOPY; DESIGN; REALIZATION; 3D;

D O I：

10.1117/1.OE.51.11.111702

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

The snapshot advantage is a large increase in light collection efficiency available to high-dimensional measurement systems that avoid filtering and scanning. After discussing this advantage in the context of imaging spectrometry, where the greatest effort towards developing snapshot systems has been made, we describe the types of measurements where it is applicable. We then generalize it to the larger context of high-dimensional measurements, where the advantage increases geometrically with measurement dimensionality. (C) 2012 Society of Photo-Optical Instrumentation Engineers (SPIE). [DOI: 10.1117/1.OE.51.11.111702]

引用

页数：7

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