共 5 条
Robust Fault Isolation With Statistical Uncertainty in Identified Parameters
被引:13
作者:
Dong, Jianfei
[1
]
Verhaegen, Michel
[1
]
Gustafsson, Fredrik
[2
]
机构:
[1] Delft Univ Technol, NL-2628 CD Delft, Netherlands
[2] Linkoping Univ, Dept Elect Engn, SE-58183 Linkoping, Sweden
关键词:
Additive faults;
closed-form solution;
fault isolation;
parameter uncertainty;
statistical analysis;
D O I:
10.1109/TSP.2012.2208639
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
This correspondence is a companion paper to [J. Dong, M. Verhaegen, and F. Gustafsson, "Robust Fault Detection With Statistical Uncertainty in Identified Parameters," IEEE Trans. Signal Process., vol. 60, no. 10, Oct. 2012], extending it to fault isolation. Also, here, use is made of a linear in the parameters model representation of the input-output behavior of the nominal system (i.e. fault-free). The projection of the residual onto directions only sensitive to individual faults is robustified against the stochastic errors of the estimated model parameters. The correspondence considers additive error sequences to the input and output quantities that represent failures like drift, biased, stuck, or saturated sensors/actuators.
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页码:5556 / 5561
页数:7
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