Measuring Multiresolution Surface Roughness Using V-System

被引:7
作者
Cao, Wei [1 ]
Cai, Zhanchuan [1 ]
Ye, Ben [1 ]
机构
[1] Macau Univ Sci & Technol, Fac Informat Technol, Macau 999078, Peoples R China
来源
IEEE TRANSACTIONS ON GEOSCIENCE AND REMOTE SENSING | 2018年 / 56卷 / 03期
基金
中国国家自然科学基金;
关键词
Digital elevation model (DEM); surface roughness; V-system; ORBITER LASER ALTIMETER; TOPOGRAPHIC ROUGHNESS; SCALE DEPENDENCE; TERRAIN;
D O I
10.1109/TGRS.2017.2764519
中图分类号
P3 [地球物理学]; P59 [地球化学];
学科分类号
0708 ; 070902 ;
摘要
Surface roughness is a land-surface parameter that is widely used in terrain analysis. Some typical roughness details, which have important effects on surface analysis, fail to be characterized on previous roughness maps. The objective of this paper is to provide a more accurate small-to-large scale roughness overview. The new roughness method is designed based on a complete orthogonal system called the V-system. The V-system roughness utilizes the special functions to detect and extract the roughness characteristics from high-resolution digital elevation models (DEMs). In this paper, Lunar Orbiter Laser Altimeter-derived DEMs are used as the source data for the roughness calculation. Compared with the global root-mean-square slope and Fourier-based roughness maps, the V-system roughness maps show that more typical roughness details have been added to clearly indicate the small roughness variations on the large map. Furthermore, the reliability and practicability of V-system roughness are demonstrated based on the multiresolution DEMs. As an example, the statistical parameters of the roughness characteristics in the lunar Maria and highlands identify the fact that the highlands are rougher at all scales than the Maria. And this difference corresponds to the basic roughness property.
引用
收藏
页码:1497 / 1506
页数:10
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