Drift correction in ptychographic diffractive imaging

被引:62
作者
Beckers, Mike [1 ]
Senkbeil, Tobias [1 ,2 ]
Gorniak, Thomas [1 ,2 ]
Giewekemeyer, Klaus [4 ]
Salditt, Tim [4 ]
Rosenhahn, Axel [1 ,2 ,3 ]
机构
[1] Heidelberg Univ, D-69120 Heidelberg, Germany
[2] Karlsruhe Inst Technol, Inst Funct Interfaces, IFG, D-76021 Karlsruhe, Germany
[3] Ruhr Univ Bochum, D-44780 Bochum, Germany
[4] Univ Gottingen, Inst XRay Phys, D-37077 Gottingen, Germany
关键词
X-Ray microscopy; Ptychography; Drift correction; X-RAY-DIFFRACTION; MICROSCOPY;
D O I
10.1016/j.ultramic.2012.11.006
中图分类号
TH742 [显微镜];
学科分类号
摘要
X-ray ptychography is a rapidly developing phase retrieval technique that combines the experimental advantages of coherent diffractive imaging with the possibility to image extended specimens. Data collection requires imaging at several scan points with high positional accuracy, which implies susceptibility to mechanical drift. This is a well-known problem in ptychographic scans, which can reduce reconstruction quality and limit the achievable resolution. Using a simple model for positional drift, we show that a set of corrected positions can be found systematically, leading to strong improvements in the reconstruction of a Siemens star dataset severely affected by drift. (c) 2012 Elsevier B.V. All rights reserved.
引用
收藏
页码:44 / 47
页数:4
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