Electron-Ion Collision Studies with Highly Charged Sulfur Ions

被引：0

作者：

Ali, S. ^{[1
]}

Mahmood, S. ^{[1
]}

Orban, I. ^{[1
]}

Tashenov, S. ^{[1
]}

Li, Y. M. ^{[2
]}

Wu, Z. ^{[2
]}

Schuch, R. ^{[1
]}

机构：

[1] Stockholm Univ, Albanova Univ Ctr, Dept Phys, S-10691 Stockholm, Sweden

[2] Inst Appl Phys & Computat Math, Beijing 100088, Peoples R China

来源：

XXVII INTERNATIONAL CONFERENCE ON PHOTONIC, ELECTRONIC AND ATOMIC COLLISIONS (ICPEAC 2011), PTS 1-15 | 2012年 / 388卷

关键词：

D O I：

10.1088/1742-6596/388/6/062046

中图分类号：

O64 [物理化学（理论化学）、化学物理学]; O56 [分子物理学、原子物理学];

学科分类号：

070203 ; 070304 ; 081704 ; 1406 ;

摘要：

We have obtained dielectronic recombination (DR) cross sections for H-like and He-like S, using the Stockholm Refrigerated Electron Beam Ion Trap (R-EBIT). The experimental results are compared with a calculation for the resonance positions and strengths and show good agreement within the error bars, but also deviations in some cases.

引用

页数：1