Investigation of 1024 x 10 multirow focal plane arrays based on the solid solution of mercury-cadmium-telluride

A technique for measuring photoelectric parameters of focal plane arrays (FPAs) with time delay and integration (TDI) operation mode without optical-mechanical scanning is presented. A feature of the FPA is the presence of disconnectable high-pass filters in the input cells of the large-scale integration circuit (LSI), which makes it possible to subtract the inconclusive constant component of the signal. A blackbody (BB) with modulator is used as an optical signal source. The criterion of selection of the modulation frequency is the TDI period and the amplitude-frequency characteristics of the FPA. In order to perform correct measurements of signal values, parameters of a nonrecursive TDI filter are calculated. Values of the FPA noise are obtained by subtracting the periodic amplitude modulation. The dependence of background irradiances on the photodetector is calculated and the dependence of the FPA noise on the background temperature is constructed. The internal FPA noise is calculated and numerical values of measured parameters are presented.