R factors in Rietveld analysis:: How good is good enough?

被引：1173

作者：

Toby, BH ^{[1
]}

机构：

[1] Argonne Natl Lab, Adv Photon Source, XOR, BESSRC, Argonne, IL 60439 USA

来源：

POWDER DIFFRACTION | 2006年 / 21卷 / 01期

关键词：

D O I：

10.1154/1.2179804

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

The definitions for important Rietveld error indices are defined and discussed. It is shown that while smaller error index values indicate a better fit of a model to the data, wrong models with poor quality data may exhibit smaller values error index values than some superb models with very high quality data. (c) 2006 International Centre for Diffraction Data.

引用

页码：67 / 70

页数：4

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