Modifying the critical current anisotropy of YBCO films via buffering layers on IBAD-MgO based templates

被引：2

作者：

Khan, M. Z. ^{[1
,2
]}

Rivasto, E. ^{[1
,2
]}

Wu, Y. ^{[3
]}

Zhao, Y. ^{[3
]}

Chen, C. ^{[4
]}

Zhu, J. ^{[4
]}

Palonen, H. ^{[1
]}

Tikkanen, J. ^{[1
]}

Huhtinen, H. ^{[1
]}

Paturi, P. ^{[1
]}

机构：

[1] Univ Turku, Dept Phys & Astron, Wihuri Phys Lab, FI-20014 Turku, Finland

[2] Univ Turku, Grad Sch UTUGS, FI-20014 Turku, Finland

[3] Shanghai Jiao Tong Univ, Sch Elect Informat & Elect Engn, Shanghai 200240, Peoples R China

[4] Shanghai Superconductor Technol Co Ltd, Shanghai 200240, Peoples R China

来源：

14TH EUROPEAN CONFERENCE ON APPLIED SUPERCONDUCTIVITY (EUCAS2019) | 2020年 / 1559卷

关键词：

THICKNESS-DEPENDENT PROPERTIES; THIN-FILMS; DIFFRACTION; DEFECTS;

D O I：

10.1088/1742-6596/1559/1/012037

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The role of variations in the buffer layer structure of IBAD-MgO based templates on the critical current anisotropy has been investigated in undoped and BaZrO3 (BZO) doped YBa2Cu3O6+x (YBCO) films. Not only do the natural defects grow distinct within the undoped YBCO lattice but also due to the different lengths of BZO induced nanorods within the YBCO matrix, the flux pinning properties are greatly affected by the underlying layers which in turn has a great impact on the angular dependent critical current density J(c)(theta). This has been verified by transport measurements where the shape of the J(c)(theta)varies in accordance with the substrates. Based on our results, the template having a cap layer with the minimum lattice mismatch and a good chemical compatibility with deposited YBCO is proven to be the best for growing both the undoped and BZO doped YBCO films. Furthermore, a model we can present based on the shapes of J(c)(theta) curves depicts how the formation of nanosized defects affects the flux pinning anisotropy.

引用

页数：10

共 27 条

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