Active Shaping of Voltage/Current in Transmission Lines - EMC/SI Applications

被引:0
|
作者
Al Ibrahim, Ali [1 ]
Chauviere, Cddrie [2 ]
Bonnet, Pierre [1 ]
机构
[1] Univ Clermont Auvergne, CNRS, SIGMA Clermont, Inst Pascal, F-63000 Clermont Ferrand, France
[2] Univ Clermont Auvergne, CNRS, UMR 6620, LMBP, F-63171 Clermont Ferrand, France
来源
PROCEEDINGS OF THE 2019 INTERNATIONAL CONFERENCE ON ELECTROMAGNETICS IN ADVANCED APPLICATIONS (ICEAA) | 2019年
关键词
Electromagnetic interference control; fault; signal integrity; source identification; transmission line (TL); SOURCE IDENTIFICATION; FIELD; EMISSIONS;
D O I
10.1109/iceaa.2019.8879093
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this paper, we present the general theory of the linear combination of configuration field (LCCF) method. This technique allows to determine the temporal profile of the source needed to generate a given signal at a specified time and location in a transmission-line network. We present two applications, one in the framework of signal integrity and another in the framework of electromagnetic compatibility problems. With a view to consider experimental tests, linear constraints are then added to improve the computed signal through reducing its high frequencies as well as its amplitudes.
引用
收藏
页码:28 / 32
页数:5
相关论文
共 24 条
  • [21] Application of Split Ring Resonator (SRR) Loaded Transmission Lines to the Design of Angular Displacement and Velocity Sensors for Space Applications
    Mata-Contreras, Javier
    Herrojo, Cristian
    Martin, Ferran
    IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 2017, 65 (11) : 4450 - 4460
  • [22] Do High-Voltage Power Transmission Lines Affect Forest Landscape and Vegetation Growth: Evidence from a Case for Southeastern of China
    Li, Xiang
    Lin, Yuying
    FORESTS, 2019, 10 (02)
  • [23] Temperature Dependent Current-Voltage Characteristics of Co0.65Zn0.35Fe2O4/n-Si Magnetic Diode Like Structure
    Kumar, A. Santhosh
    Panda, J.
    Nath, T. K.
    ADVANCED SCIENCE LETTERS, 2014, 20 (3-4) : 617 - 621
  • [24] Analysis of Double Gaussian Distribution at the Interface of Ni/Ta2O5/P-Si Schottky Barrier Diodes Using Temperature Dependent Current-Voltage (I-V) Measurements
    Reddy, Nallabala Nanda Kumar
    Kukkambakam, Chandramohan
    Manjunath, V.
    Reddy, Vasudeva Reddy Minnam
    SILICON, 2021, 13 (01) : 65 - 71