800meV localization energy in GaSb/GaAs/Al0.3Ga0.7As quantum dots

被引:39
作者
Nowozin, T. [1 ]
Bonato, L. [1 ]
Hoegner, A. [1 ]
Wiengarten, A. [1 ]
Bimberg, D. [1 ]
Lin, Wei-Hsun [2 ]
Lin, Shih-Yen [2 ]
Reyner, C. J. [3 ,4 ]
Liang, Baolai L. [3 ,4 ]
Huffaker, D. L. [3 ,4 ]
机构
[1] Tech Univ Berlin, Inst Festkorperphys, D-10623 Berlin, Germany
[2] Acad Sinica, Res Ctr Appl Sci, Taipei 115, Taiwan
[3] Univ Calif Los Angeles, Dept Elect Engn, Los Angeles, CA 90095 USA
[4] Univ Calif Los Angeles, Calif Nanosyst Inst, Los Angeles, CA 90095 USA
关键词
GASB; SEMICONDUCTORS; EVOLUTION; HOLE;
D O I
10.1063/1.4791678
中图分类号
O59 [应用物理学];
学科分类号
摘要
The localization energies, capture cross sections, and storage times of holes in GaSb quantum dots (QDs) are measured for three GaSb/GaAs QD ensembles with different QD sizes. The structural properties, such as height and diameter, are determined by atomic force microscopy, while the electronic properties are measured using deep-level transient spectroscopy. The various QDs exhibit varying hole localization energies corresponding to their size. The maximum localization energy of 800 (+/- 50) meV is achieved by using additional Al0.3Ga0.7As barriers. Based on an extrapolation, alternative material systems are proposed to further increase the localization energy and carrier storage time of QDs. (C) 2013 American Institute of Physics. [http://dx.doi.org/10.1063/1.4791678]
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页数:4
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