Effects of Ag layer and ZnO top layer thicknesses on the physical properties of ZnO/Ag/Zno multilayer system

被引：71

作者：

Mohamed, S. H. ^{[1
,1
]}

机构：

[1] Qassim Univ, Coll Sci, Dept Phys, Buraydah 81999, Saudi Arabia

来源：

JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS | 2008年 / 69卷 / 10期

关键词：

Multilayers; Oxides; Optical properties;

D O I：

10.1016/j.jpcs.2008.03.019

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Two groups of transparent conductive ZnO/Ag/ZnO, ZAZ, multilayer coatings were successively deposited by direct current (DC) magnetron sputtering. Sputtering was carried out from zinc (Zn) and silver (Ag) metallic targets. The effects of Ag layer thickness and ZnO top layer thickness on the properties of the ZAZ multilayer system were examined using different analytical methods. The influences of the Ag layer thickness and ZnO top layer thickness on structural properties were studied using X-ray diffraction. The thicknesses of ZAZ multilayer system were determined using X-ray reflectometry. A sheet resistance of 2.3 Omega/sq at an Ag layer thickness of 17.7 mm was obtained. The sheet resistance changes slightly with ZnO top layer thickness. The optical properties of the films were analyzed. Both Ag layer thickness and ZnO top layer thickness affect transmittance. The optical constants of the ZAZ multilayer system were calculated from transmittance and reflectance measurements. The figure of merit was applied on the ZAZ coatings and the most suitable films for the application as transparent conductive electrodes were determined. (C) 2008 Elsevier Ltd. All rights reserved.

引用

页码：2378 / 2384

页数：7

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